Emerging Paradigms in VLSI and Semiconductor Manufacturing Leveraging AI-Driven Process Control and Defect Detection Techniques. ISCSITR- INTERNATIONAL JOURNAL OF COMPUTER SCIENCE AND ENGINEERING (ISCSITR-IJCSE), [S. l.], v. 6, n. 1, p. 1–12, 2025. Disponível em: https://iscsitr.com/index.php/ISCSITR-IJCSE/article/view/ISCSITR-IJCSE_2025_06_01_001.. Acesso em: 23 dec. 2024.